N₂O Ice at 65-80 K
| Sample Type | Ice |
|---|---|
| Components | N₂O |
| Ratio | 1 |
| Substrate | KBr and NaF |
| Phase / State | Polycrystalline |
| Reference Temperature | 65-80 K |
| Wavenumber (cm⁻¹) | 9090.909 - 9090.909 |
| Wavelength (µm) | 1.1 - 1.1 |
Polycrystalline nitrous oxide (N₂O) ice deposited at a temperature between 65 and 80 K onto potassium bromide (KBr), and sodium fluoride (NaF) substrates, and held at a temperature between 65 and 80 K during spectroscopic measurements.
The real part (n) of the complex index of refraction was determined at 1.1 µm using optical measurements done at a temperature between 65 and 80 K, from the interference fringes formed as nitrous oxide thin films were deposited on different substrates of known refractive index.
Error bars/uncertainties are provided in the downloadable data.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Yamada, H. and Person, W. B. (1964) 'Absolute Infrared Intensities of the Fundamental Absorption Bands in Solid CO₂ and N₂O', The Journal of Chemical Physics, 41:8, pp. 2478-2487.