Gas Tholin From PH₃:H₂ (3:97) at 300 K
| Sample Type | Gas Tholin |
|---|---|
| Components | PH₃:H₂ |
| Ratio | 3:97 |
| Substrate | SiO₂ |
| Reference Temperature | 300 K |
| Wavenumber (cm⁻¹) | 16666.667 - 40000 |
| Wavelength (µm) | 0.25 - 0.6 |
Jupiter gas tholin sample produced from phosphine:hydrogen (PH₃:H₂ with a 3:97 ratio) gas precursors by UV photolysis at 300 K temperature and 1 bar pressure at Department of Geophysics and Planetary Sciences, Tel-Aviv University, Ramat Aviv, Israel.
Tholin sample deposited on quartz (SiO₂) substrate. Film thickness of ~0.12 µm.
The real part (n) of the complex index of refraction was determined from optical measurements done at room temperature, with the sodium D line (λ = 5893 Å) by the immersion technique. The imaginary part (k) of the complex index of refraction was determined from optical measurements done at room temperature, by absorption spectroscopy from 0.25 to 0.6 µm.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Noy, N., Podolak, M. and Bar-Nun, A. (1981) 'Photochemistry of Phosphine and Jupiter's Great Red Spot', Journal of Geophysical Research, 86:C12, pp. 11985-11988.