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CH₄ Ice at 20 K


Ice Datasets
Description
Sample Type Ice
Components CH₄
Ratio 1
Substrate Si
Phase / State Crystalline
Reference Temperature 20 K
Wavenumber (cm⁻¹) 5000 - 25000
Wavelength (µm) 0.4 - 2

Crystalline methane (CH₄) ice deposited at 10 K onto a silicon (Si) substrate, then annealed at 20 K, and held at 20 K during spectroscopic measurements.

The real part (n) of the complex index of refraction was calculated from 0.4 to 2.0 μm from the refractive indices of liquid CH₄ at 110 K and the densities of liquid and solid CH₄.

More information can be found in the publication and on the OCdb contributor's page.

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n

References

Any use of this data should recognize the parent publication(s):

Khare, B. N., Thompson, W. R., Sagan, C., Arakawa, E. T., Bruel, C., Judish, J. P., Khanna, R. K. and Pollack, J. B. (1990) 'Optical Constants of Solid Methane', pp. 327-339 in NASA Conference Publication 3077, First International Conference on Laboratory Research for Planetary Atmospheres, Proceedings of a conference held at Bowie State University, Bowie, Maryland, October 25-27, 1989.

n Values