Gas Tholin From CH₄:He:H₂ (0.03:0.25:0.72) at 300 K
| Sample Type | Gas Tholin |
|---|---|
| Components | CH₄:He:H₂ |
| Ratio | 0.03:0.25:0.72 |
| Substrate | SiO₂ and CsI |
| Reference Temperature | 300 K |
| Wavenumber (cm⁻¹) | 4000 - 25000 |
| Wavelength (µm) | 0.4 - 2.5 |
Uranus and Neptune gas tholin sample produced from methane:helium:hydrogen (CH₄:He:H₂ with a 0.03:0.25:0.72 ratio) gas precursors by RF plasma discharge at 300 K temperature and 0.13 mbar pressure at Laboratory for Planetary Studies, Cornell University, Ithaca, NY, USA.
Tholin sample deposited on glass (SiO₂) and cesium iodide (CsI) substrates. Film thickness estimated to be between 4 and 7 μm at measurement location in the dark area.
The real (n) and imaginary (k) parts of the complex index of refraction were determined from optical measurements done at room temperature, by a combination of ellipsometry and transmission techniques from 0.4 to 2.5 µm.
For the dark area of the sample, n = 1.67 ± 0.05.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Khare, B. N., Sagan, C., Thompson, W. R., Arakawa, E. T. and Votaw, P. (1987) 'Solid Hydrocarbon Aerosols Produced in Simulated Uranian and Neptunian Stratospheres', Journal of Geophysical Research, 92:A13, pp. 15067-15082.