Gas Tholin From CH₄:H₂ (0.005:0.995) at 300 K
| Sample Type | Gas Tholin |
|---|---|
| Components | CH₄:H₂ |
| Ratio | 0.005:0.995 |
| Substrate | SiO₂ and CsI |
| Reference Temperature | 300 K |
| Wavenumber (cm⁻¹) | 12500 - 33333.333 |
| Wavelength (µm) | 0.3 - 0.8 |
Uranus and Neptune gas tholin sample produced from methane:hydrogen (CH₄:H₂ with a 0.005:0.995 ratio) gas precursors by RF plasma discharge at 300 K temperature and 0.66 mbar pressure at Laboratory for Planetary Studies, Cornell University, Ithaca, NY, USA.
Tholin sample deposited on glass (SiO₂) and cesium iodide (CsI) substrates. Film thickness of 10 μm at measurement location.
The imaginary part (k) of the complex index of refraction was determined from optical measurements done at room temperature, by transmission spectroscopy from 0.3 to 0.8 µm.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Khare, B. N., Sagan, C., Thompson, W. R., Arakawa, E. T. and Votaw, P. (1987) 'Solid Hydrocarbon Aerosols Produced in Simulated Uranian and Neptunian Stratospheres', Journal of Geophysical Research, 92:A13, pp. 15067-15082.