Gas Tholin From N₂:CO₂:CH₄ (90:8:2) at 300 K
| Sample Type | Gas Tholin |
|---|---|
| Components | N₂:CO₂:CH₄ |
| Ratio | 90:8:2 |
| Substrate | Si |
| Reference Temperature | 300 K |
| Wavenumber (cm⁻¹) | 17356.39 - 37026.966 |
| Wavelength (µm) | 0.27 - 0.576 |
Early Earth and Earth-like exoplanet gas tholin sample produced from nitrogen:carbon dioxide:methane (N₂:CO₂:CH₄ with a 90:8:2 ratio) gas precursors by RF plasma discharge at 300 K temperature and 0.95 mbar pressure in the PAMPRE experimental setup at Laboratoire ATMosphère Observations Spatiales (LATMOS), Guyancourt, France.
Tholin sample deposited on silicon (Si) substrate. Film thickness of ~10.49 nm.
The real (n) and imaginary (k) parts of the complex index of refraction were determined from optical measurements done at room temperature, in ambient air, by spectroscopic ellipsometry from 270 to 576 nm.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Gavilan, L., Broch, L., Carrasco, N., Fleury, B. and Vettier, L. (2017) 'Organic Aerosols in the Presence of CO₂ in the Early Earth and Exoplanets: UV-Vis Refractive Indices of Oxidized Tholins', The Astrophysical Journal Letters, 848, L5.