Gas Tholin From N₂:CH₄:CO₂ (95:2:3) at 300 K
| Sample Type | Gas Tholin |
|---|---|
| Components | N₂:CH₄:CO₂ |
| Ratio | 95:2:3 |
| Substrate | MgF₂ (for the UV-Vis-NIR region) and Si (for the MIR-FIR region) |
| Reference Temperature | 300 K |
| Wavenumber (cm⁻¹) | 333.384 - 33333.333 |
| Wavelength (µm) | 0.3 - 29.995 |
Exoplanet gas tholin sample produced from nitrogen:methane:carbon dioxide (N₂:CH₄:CO₂ with a 95:2:3 ratio) gas precursors by RF plasma discharge at 300 K temperature and 0.85 hPa pressure in the PAMPRE experimental setup at Laboratoire ATMosphère Observations Spatiales (LATMOS), Guyancourt, France.
Tholin sample deposited on magnesium fluoride (MgF₂) and silicon (Si) substrates. Film thicknesses ranging from 750 to 855 nm.
The real (n) and imaginary (k) parts of the complex index of refraction were determined from optical measurements done at room temperature, in ambient air, by transmission spectroscopy from 0.3 to 30 µm.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Drant, T., Garcia-Caurel, E., Perrin, Z., Sciamma-O'Brien, E., Carrasco, N., Vettier, L., Gautier, T., Brubach, J.-B., Roy, P., Kitzmann, D. and Heng, K. (2024) 'Optical constants of exoplanet haze analogs from 0.3 to 30 µm: Comparative sensitivity between spectrophotometry and ellipsometry', Astronomy & Astrophysics, 682, A6.