Pure H2O (1) Ice at 176 K
| Sample Type | Ice |
|---|---|
| Components | H2O |
| Ratio | 1 |
| Substrate | Si |
| Reference Temperature | 176 K |
| Wavenumber (cm⁻¹) | 3721.015 - 6981.188 |
| Wavelength (µm) | 1.432 - 2.687 |
Polycrystalline hexagonal water (H2O) ice deposited at 176 K onto a silicon (Si) substrate, and held at 176 K during spectroscopic measurements.
The real (n) and imaginary (k) parts of the complex index of refraction were determined using optical measurements done at a temperature of 176 K, by infrared transmission spectroscopy from 6981 to 3721 cm⁻¹ with a resolution of 4 cm⁻¹.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Rajaram, B., Glandorf, D. L., Curtis, D. B., Tolbert, M. A., Toon, O. B. and Ockman, N. (2001) 'Temperature-dependent optical constants of water ice in the near-infrared: new results and critical review of the available measurements', Applied Optics, 40:25, pp. 4449-4462.