Pure CO2 (1) Ice at 12.5 K
| Sample Type | Ice |
|---|---|
| Components | CO2 |
| Ratio | 1 |
| Substrate | Si |
| Reference Temperature | 12.5 K |
| Wavenumber (cm⁻¹) | 500 - 4200 |
| Wavelength (µm) | 2.381 - 20 |
Carbon dioxide (CO2) ice deposited at 12.5 K onto a silicon (Si) substrate, and held at 12.5 K during spectroscopic measurements.
The real (n) and imaginary (k) parts of the complex index of refraction were determined using optical measurements done at a temperature of 12.5 K and a pressure < 1E-7 mbar, by infrared transmission spectroscopy from 4200 to 500 cm⁻¹ with a resolution of 2 cm⁻¹.
More information can be found in the publication and on the OCdb contributor's page.
Any use of this data should recognize the parent publication(s):
Baratta, G. A. and Palumbo, M. E. (1998) 'Infrared optical constants of CO and CO2 thin icy films', Journal of the Optical Society of America A - Optics, image science and vision, 15:12, pp. 3076-3085.